Article Dans Une Revue Microelectronics Reliability Année : 2025

Design-of-Experiments and ALT plan for reliability qualification of chip resistors based on mission profile of AIMDs

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Chip resistors are integral components of electronic devices, including Active Implantable Medical Devices. This work, as part of RECOME project, is focusing on developing a methodology for defining accelerated life test plans to qualify chip resistors as per the mission profile of AIMDs. This will be done by combining design of experiments and accelerated life tests associated with failure mechanisms. Defining test protocols, such as thermal cycling, will be a critical component of this work.

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hal-05080699 , version 1 (23-05-2025)

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F.-E. Indmeskine, Laurent Saintis, Abdessamad Kobi, H. Marceau. Design-of-Experiments and ALT plan for reliability qualification of chip resistors based on mission profile of AIMDs. Microelectronics Reliability, 2025, 170, pp.115773. ⟨10.1016/j.microrel.2025.115773⟩. ⟨hal-05080699⟩
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