Predictive Reliability Modelling Based On Combination Of DoE And ALT
Résumé
Crossed array design is a method in the design of experiments used to study the effects of controllable and noise factors on the response of a system. This approach is not commonly used in accelerated life testing for the study of the reliability of electronic components. However, it can enhance predictive reliability modeling. This article presents a methodology for applying the approach to surface-mount ceramic capacitors. It defines a predictive reliability model based on state-of-the-art techniques and estimates parameters using MATLAB. The analysis of the results shows that calculating the signal-to-noise ratio is a useful strategy for understanding the impact of technological factors on the lifetime of ceramic capacitors.