@article{alrashid:hal-03794416, TITLE = {{Coupling simulation and accelerated degradation model for reliability estimation: Application to a voltage regulator}}, AUTHOR = {Al Rashid, Jaber and Saintis, Laurent and Koohestani, Mohsen and Barreau, Mihaela}, URL = {https://hal.science/hal-03794416}, JOURNAL = {{Microelectronics Reliability}}, HAL_LOCAL_REFERENCE = {SFD}, PUBLISHER = {{Elsevier}}, VOLUME = {138}, PAGES = {114682}, YEAR = {2022}, MONTH = Nov, DOI = {10.1016/j.microrel.2022.114682}, KEYWORDS = {Degradation path model ; Electrical simulation model ; Reliability performance estimation ; Lifetime data distribution ; Failure threshold ; Accelerated degradation}, PDF = {https://hal.science/hal-03794416/file/ESREf2022%20Microelectronics_Jaber%20%281%29.pdf}, HAL_ID = {hal-03794416}, HAL_VERSION = {v1}, }