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Poster De Conférence Année : 2022

Combined x-ray reflectivity and grazing incidence x-ray fluorescence analysis of a Ta/Cr/Pt trilayer stack

Résumé

Measurements of X-ray reflectivity (XRR) and Grazing incidence x-ray fluorescence (GIXRF) were performed at the Métrologie beamline of SOLEIL synchrotron with the CASTOR setup with 6.25 keV incident photons.
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Dates et versions

hal-03936392 , version 1 (20-01-2023)

Identifiants

  • HAL Id : hal-03936392 , version 1

Citer

Philippe Jonnard, Yves Ménesguen. Combined x-ray reflectivity and grazing incidence x-ray fluorescence analysis of a Ta/Cr/Pt trilayer stack. EXRS 2022, European Conference on X-ray Spectrometry, Jun 2022, Bruges, Belgium. ⟨hal-03936392⟩
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